Japan, July 14 -- SEMICONDUCTOR ENERGY LAB CO LTD has got intellectual property rights for 'ABNORMALITY DETECTION DEVICE OF SECONDARY BATTERY.' Other related details are as follows:
Application Number: JP,2025-035251
Category (FI): H02J7/82,H02J7/84,G01R31/367,G01R31/378,G01R31/389,G01R31/396,H01M10/48@P,H02J7/00@Y,H02J7/00,H02J7/50,H02J7/80
Stage: PROBLEM TO BE SOLVED: To provide a control system of secondary battery that performs abnormality detection while predicting other parameters, such as internal resistance and SOC with high accuracy.SOLUTION: A Kalman filter is used to detect a difference between an observed value (voltage) at a given time point and a voltage estimated using a prior state variable. A threshold voltage is set in advance and sudden abnormality, in particular micro short circuit, is detected by the detected difference voltage. In addition, neural network is used to learn data of time-series difference voltage. It is preferably determined and detected whether it is abnormal or normal.SELECTED DRAWING: Figure 2 (Grant)
Filing Date: March 6, 2025
Publication Date: May 20, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
