Japan, June 10 -- SYSMEX CORP has got intellectual property rights for 'ACCURACY CONTROL SPECIMEN MEASUREMENT METHOD AND SPECIMEN ANALYZER.' Other related details are as follows:
Application Number: JP,2023-052697
Category (FI): G01N35/02@Z,G01N35/00@E
Stage: Grant (IP right document published.)
Filing Date: March 29, 2023
Publication Date: June 9, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
