Japan, Feb. 24 -- RIGAKU CORP,CHUBU ELECTRIC POWER CO INC has got intellectual property rights for 'DAMAGE MEASUREMENT METHOD, DEVICE, PROGRAM, AND X-RAY DIFFRACTION DEVICE.' Other related details are as follows:
Application Number: JP,2022-046746
Category (FI): G01N23/20008,G01N23/2055
Stage: PROBLEM TO BE SOLVED: To provide a damage measurement method, a device and a program, and an x-ray diffraction device for measuring damage in a single crystal state sample regardless of a surrounding condition.SOLUTION: A method includes the steps of: irradiating a single crystal state sample with a fine flux of white X-rays (S03); detecting a diffraction spot generated by the irradiation (S05); calculating a coefficient on a variance of an intensity distribution in a specific direction of the detected diffraction spot (S06); and identifying damage state of the sample based on the calculated coefficient. The single crystal state refers to a state in which a material is formed of a single crystal or coarse crystal grain.SELECTED DRAWING: Figure 9 (Grant)
Filing Date: March 23, 2022
Publication Date: Oct. 5, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
