Japan, July 14 -- TOSHIBA CORP has got intellectual property rights for 'DEFECT CLASSIFICATION SUPPORT DEVICE, METHOD, AND PROGRAM.' Other related details are as follows:
Application Number: JP,2023-140427
Category (FI): G06T7/00,610@Z,G01N21/956@A
Stage: PROBLEM TO BE SOLVED: To accurately calculate the feature quantity of a defect.SOLUTION: A defect classification support device according to an embodiment is provided with an acquisition unit, a first extraction unit, a second extraction unit, and a calculation unit. The acquisition unit acquires a defect image obtained by photographing the appearance of an object with a defect. The first extraction unit extracts, from the defect image, a partial defective patch image including the defect. The second extraction unit extracts, from the defect image, a partial normal patch image not including the defect. The calculation unit calculates the feature quantity of the defect on the basis of the defective patch image and the normal patch image.SELECTED DRAWING: Figure 1 (Grant)
Filing Date: Aug. 30, 2023
Publication Date: March 13, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
