Japan, March 23 -- HITACHI HIGH-TECH CORP has got intellectual property rights for 'DEFECT INSPECTION DEVICE.' Other related details are as follows:
Application Number: JP,2022-094797
Category (FI): G01N21/956@B,G01N23/2251
Stage: Grant (IP right document published.)
Filing Date: June 13, 2022
Publication Date: Dec. 25, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
