Japan, Jan. 21 -- IHI CORP has got intellectual property rights for 'EDDY CURRENT FLAW DETECTOR AND FLAW DETECTION METHOD.' Other related details are as follows:
Application Number: JP,2021-148688
Category (FI): G01N27/904
Stage: Grant (IP right document published.)
Filing Date: Sept. 13, 2021
Publication Date: March 24, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
