Japan, Sept. 16 -- HIOKI EE CORP has got intellectual property rights for 'IMPEDANCE MEASUREMENT SYSTEM.' Other related details are as follows:
Application Number: JP,2022-106913
Category (FI): G01R27/02@A
Stage: PROBLEM TO BE SOLVED: To provide an impedance measurement system capable of improving precision of measurement of impedance.SOLUTION: An impedance measurement system 1 includes a master side measuring instrument 10 for measuring impedance by supplying a measurement AC current i1 to one measurement object and a slave side measuring instrument 20 for measuring impedance of another measurement object, and the master side measuring instrument 10 has a constant current source 11 for supplying the measurement AC current and a voltage detection part 13 for outputting impedance of a sample by detecting voltage of one measurement object. By performing synchronous detection of a phase to the slave side measuring instrument 20 in the same phase as the phase of the measurement AC current, impedance of another measurement object is calculated based on the measurement AC current i1 from the constant current source 11 and voltage detected by a slave side voltmeter 23 for constituting the slave side measuring instrument 20.SELECTED DRAWING: Figure 1 (Grant)
Filing Date: July 1, 2022
Publication Date: Jan. 19, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
