Japan, Feb. 24 -- ABLIC INC has got intellectual property rights for 'MEASUREMENT CIRCUIT AND MEASUREMENT SYSTEM USING THE SAME.' Other related details are as follows:
Application Number: JP,2022-054965
Category (FI): G01R31/26@G,G01R31/27,G01R19/00@C
Stage: PROBLEM TO BE SOLVED: To provide a measurement circuit capable of accurately measuring a fine current in a small space even in combination with an inspection device having a lower accuracy in measuring a current and also capable of performing detection of a failure and acquisition of a current correction value by the inspection device.SOLUTION: A measurement circuit 100 includes: an operational amplifier 101 for forming a voltage follower to output a voltage equal to a voltage signal from an inspection device 110 to a measurement terminal 100d; a current sensing resistance 102 between an output terminal of the operational amplifier 101 and the measurement terminal 100d; an instrumentation differential amplifier 103 for amplifying a difference voltage by input terminals connected to both ends of the current sensing resistance 102 so as to output the voltage to the inspection device 110; and an operation confirmation resistance 104 where one end is connected between an input terminal of the operational amplifier 101 forming a feedback loop of the voltage follower and the current sensing resistance 102 and the other end is connected to an operation confirmation terminal 100c to be an opening state or a grounding state by the inspection device 110.SELECTED DRAWING: Figure 1 (Grant)
Filing Date: March 30, 2022
Publication Date: Oct. 13, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
