Japan, Sept. 16 -- SHIMIZU CORP has got intellectual property rights for 'MEASURING SYSTEM AND MEASURING METHOD.' Other related details are as follows:
Application Number: JP,2022-194302
Category (FI): E21D9/10@Z,G01B11/24@Z,G01C15/00,103@E
Stage: PROBLEM TO BE SOLVED: To provide a measuring system and a measuring method, capable of accurately measuring a shape of a wet portion or the like.SOLUTION: A measuring device includes: two or more scanners 5 (1, 2); data extraction means that calculates first distances between positions and the scanner 5 corresponding to all data for each divided region and calculates an average value of the first distances to extract the data corresponding to the position at which a difference from the average exceeds a first threshold value as inaccurate data; region setting means that determines a straight line passing through the position corresponding to the extracted data and the scanner 5 that has acquired the data to set a cylindrical region having the straight line as an axis line; and data interpolation means that determines a second distance between a representative position in an intersection region where the cylindrical regions cross each other and the scanner 5, and determines a difference between the second distance and the average value of the first distances, and uses data corresponding to the representative position at which the determined difference does not exceed the second threshold value to interpolate the inaccurate data.SELECTED DRAWING: Figure 1 (Grant)
Filing Date: Dec. 5, 2022
Publication Date: June 17, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
