Japan, Nov. 7 -- FEI CO has got intellectual property rights for 'METHOD FOR MONITORING TEMPERATURE IN CRYO-ELECTRON MICROSCOPY.' Other related details are as follows:
Application Number: JP,2021-052942
Category (FI): G01N23/203,G01K11/30,G01K13/12,G01N23/2251,H01J37/20@A,H01J37/244,H01J37/22,501@J,H01J37/22,502@Z,H01J37/30@Z
Stage: Grant (IP right document published.)
Filing Date: March 26, 2021
Publication Date: Oct. 11, 2021
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
