Japan, July 20 -- TOPCON CORP has got intellectual property rights for 'PARTICULATE MATTER COMPONENT MEASUREMENT METHOD AND PARTICULATE MATTER COMPONENT MEASUREMENT DEVICE.' Other related details are as follows:
Application Number: JP,2022-044314
Category (FI): G01N21/359,G01N21/3563,G01N21/53@Z
Stage: Grant (IP right granted following substantive examination.)
Filing Date: March 18, 2022
Publication Date: Sept. 29, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
