Japan, Aug. 31 -- HIOKI EE CORP has got intellectual property rights for 'TEST DEVICE AND TEST METHOD.' Other related details are as follows:
Application Number: JP,2022-048890
Category (FI): G01R27/02@A
Stage: Grant (IP right granted following substantive examination.)
Filing Date: March 24, 2022
Publication Date: Feb. 2, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
