Japan Intellectual Property Rights: X-RAY DIFFRACTION MEASUREMENT METHOD AND X-RAY DIFFRACTION MEASUREMENT DEVICE

Japan, March 3 -- NATIONAL INSTITUTES FOR QUANTUM & RADIOLOGICAL SCIENCE & TECHNOLOGY has got intellectual property rights for 'X-RAY DIFFRACTION MEASUREMENT METHOD AND X-RAY DIFFRACTION MEASUREMENT DEVICE.' Other related details are as follows:

Application Number: JP,2022-125870

Category (FI): G01N23/20,G01N23/207

Stage: Grant (IP right granted following substantive examination.)

Filing Date: Aug. 5, 2022

Publication Date: Nov. 30, 2023

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

Disclaimer: Curated by HT Syndication.