Japan, Sept. 16 -- IHI CORP,IHI INSPECTION & INSTRUMENTATION CO LTD has got intellectual property rights for 'X-RAY INSPECTION DEVICE.' Other related details are as follows:
Application Number: JP,2023-017152
Category (FI): G01N23/04,G01N23/10
Stage: PROBLEM TO BE SOLVED: To accurately specify the number of cargoes.SOLUTION: An X-ray inspection device 1 includes: an imaging unit 10 which images multiple cargoes 2 being the inspection objects by using X-rays and outputs X-ray images of the inspection objects; an image analysis unit 34 which analyzes the X-ray images of the inspection objects and obtains the distribution of luminance values of the X-ray images of the inspection objects; a feature amount extraction unit 36 which extracts a feature amount of the inspection object on the basis of the distribution of the luminance values; a storage unit 50 which stores a reference feature amount being a feature amount obtained from the distribution of the luminance values of the reference X-ray image obtained by imaging one cargo; and a counting unit 38 which calculates the number of cargoes 2 being the inspection objects on the basis of the feature amount of the inspection object and the reference feature amount.SELECTED DRAWING: Figure 2 (Grant)
Filing Date: Feb. 7, 2023
Publication Date: Aug. 20, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
